IEEE design & test of computers / IEEE des. test comput.
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Corporate Authors: | , |
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Language: | Inglés |
ISSN: | 0740-7475 1 |
Published: |
Los Alamitos, CA :
IEEE Computer Society,
c1984-
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Online Access: | http://ieeexplore.ieee.org/servlet.opac?punumber=54 |
Related Items: | Additional form:
IEEE design & test of computers Additional form: IEEE design & test of computers |