IEEE design & test of computers / IEEE des. test comput.
Guardado en:
| Autores Corporativos: | , |
|---|---|
| Idioma: | Inglés |
| ISSN: | 0740-7475 1 |
| Publicado: |
Los Alamitos, CA :
IEEE Computer Society,
c1984-
|
| Acceso en línea: | http://ieeexplore.ieee.org/servlet.opac?punumber=54 |
| Títulos relacionados: | Forma adicional:
IEEE design & test of computers Forma adicional: IEEE design & test of computers |
| LEADER | 01970nas a2200481 a 4500 | ||
|---|---|---|---|
| 001 | 9881868 | ||
| 003 | DNLM | ||
| 005 | 20130509063232.0 | ||
| 007 | cr|cnu|||||||| | ||
| 008 | 831017c19849999cauqr p 0 a0eng | ||
| 010 | |a 91641150 |z sn 83002868 | ||
| 022 | 0 | |a 0740-7475 |l 0740-7475 |2 1 |0 1 | |
| 032 | |a 732250 |b USPS | ||
| 035 | |a (DNLM)SR0055616(s) | ||
| 035 | |a (OCoLC)10024072 | ||
| 040 | |a DNLM |c DNLM | ||
| 042 | |a nsdp |a lc | ||
| 082 | 0 | 0 | |a 621.395 |2 20 |
| 210 | 0 | |a IEEE des. test comput. | |
| 222 | 0 | |a IEEE design & test of computers | |
| 245 | 0 | 0 | |a IEEE design & test of computers / |c IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc. |
| 246 | 2 | |a Institute of Electrical and Electronics Engineers design & test of computers | |
| 246 | 1 | 0 | |a IEEE design and test of computers |
| 246 | 1 | 0 | |a Design & test of computers |
| 246 | 1 | 0 | |a Design and test of computers |
| 246 | 1 | 0 | |a IEEE design and test |
| 246 | 1 | 7 | |a IEEE design & test |
| 260 | |a Los Alamitos, CA : |b IEEE Computer Society, |c c1984- | ||
| 310 | |a Quarterly, |b Mar. 1991- | ||
| 321 | |a Quarterly, |b Feb. 1984- | ||
| 321 | |a Bimonthly, |b <Oct. 1987>-Dec. 1990 | ||
| 362 | 0 | |a Vol. 1, no. 1 (Feb. 1984)- | |
| 500 | |a Title from cover. | ||
| 515 | |a Vol. 1, no. 1 also called premiere issue. | ||
| 530 | |a Also issued online. | ||
| 530 | |a Available also on microfilm and microfiche from the Institute of Electrical and Electronics Engineers. | ||
| 710 | 2 | |a IEEE Computer Society. | |
| 710 | 2 | |a Institute of Electrical and Electronics Engineers. | |
| 776 | 1 | |t IEEE design & test of computers |w (OCoLC)13246898 | |
| 776 | 1 | |t IEEE design & test of computers |w (DLC)sn 85019938 |w (OCoLC)10596192 | |
| 856 | 4 | |u http://ieeexplore.ieee.org/servlet.opac?punumber=54 | |
| 999 | |c 100232 |d 100232 | ||
| 952 | |0 0 |1 0 |4 0 |7 0 |9 2180771 |a B-CSIC-IMB-CNM |b B-CSIC-IMB-CNM |h (1985)86-2010. |o B-CSIC-IMB-CNM-2180771JNL-0740-7475 |p B-CSIC-IMB-CNM-2180771JNL-100232 |t 2890149 |y JNL | ||