IEEE transactions on reliability /

IEEE transactions on reliability / IEEE trans. reliab.

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Detalles Bibliográficos
Autores Corporativos: Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability., IEEE Reliability Group., IEEE Reliability Society., American Society for Quality Control. Electronics Division.
Idioma:Inglés
ISSN:0018-9529 1
Publicado: [New York, N.Y. : Institute of Electrical and Electronics Engineers, c1963-
Acceso en línea:http://ieeexplore.ieee.org/servlet/opac?punumber=24
Títulos relacionados:Es continuación de: IRE transactions on reliability and quality control
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246 3 |a Institute of Electrical and Electronics Engineers transactions on reliability 
246 3 0 |a Transactions on reliability 
246 3 0 |a Reliability 
260 |a [New York, N.Y. :  |b Institute of Electrical and Electronics Engineers,  |c c1963- 
300 |a v. :  |b ill. ;  |c 28 cm. 
310 |a Quarterly,  |b <1999- > 
321 |a Five no. a year  |b <, Oct. 1975-1998> 
321 |a Irregular,  |b 1963- 
362 0 |a Vol. R-12, no. 1 (Mar. 1963)- 
500 |a Title from cover. 
510 0 |a Chemical abstracts  |x 0009-2258 
530 |a Also issued online. 
550 |a Vols. for 1963- issued by the Institute of Electrical and Electronics Engineers, Professional Technical Group on Reliability: <Oct. 1975>- by the IEEE Reliability Group; <1979- > by the IEEE Reliability Society. 
550 |a Vol. for <1975- > published also as the journal of the Electronics Division, American Society for Quality Control. 
710 2 |a Institute of Electrical and Electronics Engineers.  |b Professional Technical Group on Reliability. 
710 2 |a IEEE Reliability Group. 
710 2 |a IEEE Reliability Society. 
710 2 |a American Society for Quality Control.  |b Electronics Division. 
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